Papers - NISHIOKA Kensuke
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Horita S., Nishioka K., Kaki H.
IDW/AD'05 - Proceedings of the 12th International Display Workshops in Conjunction with Asia Display 2005 ( 2 ) 1191 - 1194 2005.12
Language：Japanese Publishing type：Research paper (scientific journal) Publisher：IDW/AD'05 - Proceedings of the 12th International Display Workshops in Conjunction with Asia Display 2005
In the Si film crystallized by a linearly polarized Nd:YAG laser beam, the grain boundaries are aligned periodically. This periodic structure is produced by the periodic beam energy density profile generated by interference between the coherent incident and high order diffracted beams. The effect of multiple reflection in the Si film was investigated theoretically on the surface structure of the crystallized film. The suitable thickness for this method was estimated by this theoretical analysis and verified experimentally.
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Nishioka K., Hagihara R., Nakagami H., Tanaka A., Uraoka Y., Fuyuki T.
Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion C 2306 - 2309 2003.12
Language：Japanese Publishing type：Research paper (scientific journal) Publisher：Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion
We have analyzed field-test data collected from grid-connected PV systems for residential houses in the Tokyo area from August 1999 to July 2000 in detail, focusing on module temperature. It was demonstrated that the PV systems operated in the wide temperature range, and that the module temperature range in which the PV systems operated differed greatly even for the same type of module due to the installation environment. Further, we have discussed the influence of module temperature on annual output energy quantitatively. These results indicate that it is very important to consider the temperature characteristics of solar cells and the operation temperature of modules.
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Analysis of triple-junction solar cell under concentration by spice
Nishioka K., Takamoto T., Nakajima W., Agui T., Kaneiwa M., Uraoka Y., Fuyuki T.
Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion A 869 - 872 2003.12
Language：Japanese Publishing type：Research paper (scientific journal) Publisher：Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion
The characteristics of multi-junction solar cell under concentration were evaluated by SPICE (Simulation Program with Integrated Circuit Emphasis). We developed the multi-unit model and analyzed the affect of the chromatic aberration and intensity distribution for the multi-junction cells. In the multi-unit model, the same numbers of units as grid numbers are installed for every electrode, and the units were connected each other with the lateral resistances. In order to obtain the generation current from each diode, we measured intensity of concentrated light through the pinhole using single-junction solar cells consisted of InGaP, GaAs and Ge as detectors. By using the multi-unit model, we could successfully calculate the electrical cell performances taking the chromatic aberration and intensity distribution into account, and the calculated value agreed well with the experimental value. The multi-unit model will be very useful for cell designs and performance analysis of the concentrator cells.
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Yamamoto Y., Ishikawa Y., Nishioka K., Uraoka Y., Fuyuki T.
Conference Record of the IEEE Photovoltaic Specialists Conference 235 - 238 2002.12
Language：Japanese Publishing type：Research paper (scientific journal) Publisher：Conference Record of the IEEE Photovoltaic Specialists Conference
Thin film single crystalline silicon solar cells were fabricated and minority carrier diffusion length was evaluated using two-dimensional simulation. Effective minority carrier diffusion length (L eff ) in 19μm-thickness cell was obtained as 19 μm by the surface photovoltage (SPV) method. Further, bulk minority carrier diffusion length (L b ) was estimated to over 50 μm from fitting for external quantum efficiency (EQE) using numerical simulation. In the case of L b ≥ cell thickness, L eff estimated from SPV was limited to the thickness of the cell, and L b could not be evaluated accurately. Therefore, fitting of EQE in the wide wavelength region by two-dimensional simulator was indispensable for accurate evaluation of minority carrier diffusion length in thin single crystalline silicon solar cells.